=====EO TESTS===== Tests 1-2: A. Test channel width *10um, 5um, 2.5um B. Test number of channels [total width] *1000um, 500um, 250um, 125um Process: Choose optimal setup from tests 1-3, then run tests 4-5. Tests 3-4: C. Test interaction length D. Test reverse proton exchange vs normal ====Results==== ------------------------------------------- 1 June 2016: First device coupled at 342-343 degrees and was subsequently tested. Oscillating the voltage between 20-40 volts yielded two TE spots (modes were TM) that blinked on and off. Device ID: EOTEST3 Parameters: 2.5um waveguides, 250um total width Conclusion: This really isn't a great result. None of these devices have coupled very well. We are going to start with a new wafer and run a series of tests with dilute proton exchange to ensure excellent waveguides all the way through. ------------------------------------------- 6 June 2016: New wafer patterned, etched, cut. Wafer contains 24 devices. Running all tests on these devices. Parameters: 12um channels-2um channels, designated on device. Total EO width changed to 500um, 250um, 125um, 62.5um. Wafer contains 4 of each type of sample for redundancy purposes. ^ Channel width ^ Device number ^ Proton Exchange ^ Coupling < ^ Test Results ^ | 12um | 1 | - | - | round corner | | 12um | 2 | 4.5hr DPE | R351 |~3 degrees deflection| | 12um | 3 | | | | | 12um | 4 | - | - | round corner | | 10um | 1 | 4.5hr DPE | R351,347 | | | 10um | 2 | | | | | 10um | 3 | | | | | 10um | 4 | | | | | 8um | 1 | 4.5hr DPE | | | | 8um | 2 | | | | | 8um | 3 | | | | | 8um | 4 | | | | | 6um | 1 | 4.5hr DPE | | | | 6um | 2 | none |bounce test | no EO effects | | 6um | 3 | | | | | 6um | 4 | | | | | 4um | 1 | Need pattern | | | | 4um | 2 | Need pattern | | | | 4um | 3 | Need pattern | | | | 4um | 4 | Need pattern | | | | 2um | 1 | - | - | round corner | | 2um | 2 | Need pattern | | | | 2um | 3 | Need pattern | | | | 2um | 4 | - | - | round corner | {{:full_streak_eo.png?200|}} Streak Check on Sample 10UMCH1 after PE and Anneal.