F1

The following circuit was used in testing these devices:

This is the first EO device that uses variable path lengths instead of Resistor Bridges.

I will call these VPL EO devices.

It has 200nm Al that was patterned with a design by Christopher. It was then Proton Exchanged with the new proton exchange parameters 15min with a 45min Anneal at 375°C. Then 200nm Aluminum was used to create the connection strips.