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eo_tests

EO TESTS

Tests 1-2:

A. Test channel width

  • 10um, 5um, 2.5um

B. Test number of channels [total width]

  • 1000um, 500um, 250um, 125um

Process: Choose optimal setup from tests 1-3, then run tests 4-5.

Tests 3-4:

C. Test interaction length

D. Test reverse proton exchange vs normal

Results


1 June 2016: First device coupled at 342-343 degrees and was subsequently tested. Oscillating the voltage between 20-40 volts yielded two TE spots (modes were TM) that blinked on and off.

Device ID: EOTEST3

Parameters: 2.5um waveguides, 250um total width

Conclusion: This really isn't a great result. None of these devices have coupled very well. We are going to start with a new wafer and run a series of tests with dilute proton exchange to ensure excellent waveguides all the way through.


6 June 2016: New wafer patterned, etched, cut. Wafer contains 24 devices.

Running all tests on these devices.

Parameters:

12um channels-2um channels, designated on device. Total EO width changed to 500um, 250um, 125um, 62.5um. Wafer contains 4 of each type of sample for redundancy purposes.

Channel width Device number Proton Exchange Coupling < Test Results
12um 1 - - round corner
12um 2 4.5hr DPE R351 ~3 degrees deflection
12um 3
12um 4 - - round corner
10um 1 4.5hr DPE R351,347
10um 2
10um 3
10um 4
8um 1 4.5hr DPE
8um 2
8um 3
8um 4
6um 1 4.5hr DPE
6um 2 none bounce test no EO effects
6um 3
6um 4
4um 1 Need pattern
4um 2 Need pattern
4um 3 Need pattern
4um 4 Need pattern
2um 1 - - round corner
2um 2 Need pattern
2um 3 Need pattern
2um 4 - - round corner

Streak Check on Sample 10UMCH1 after PE and Anneal.

eo_tests.txt · Last modified: 2016/06/13 12:03 by jkimbal2